Logic-timing Simulation and the Degradation Delay ModelImperial College Press, 2006 - 267 էջ This book provides the reader with an extensive background in the field of logic-timing simulation and delay modeling. It includes detailed information on the challenges of logic-timing simulation, applications, advantages and drawbacks. The capabilities of logic-timing are explored using the latest research results that are brought together from previously disseminated materials. An important part of the book is devoted to the description of the ?Degradation Delay Model?, developed by the authors, showing how the inclusion of dynamic effects in the modeling of delays greatly improves the application cases and accuracy of logic-timing simulation. These ideas are supported by simulation results extracted from a wide range of practical applications.Sample Chapter(s) |
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Արդյունքներ 59–ի 1-ից 5-ը:
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... calculations and results .66 3.4 Inertial Effect .67 3.4.1 Inertial delay model failure .67 3.4.2 Inertial effect algorithm .71 3.4.3 Results .72 Introduction 4 CMOS Inverter Degradation Delay Model 4.1 4.2 Technological Parameters 4.3 ...
... calculations and results .66 3.4 Inertial Effect .67 3.4.1 Inertial delay model failure .67 3.4.2 Inertial effect algorithm .71 3.4.3 Results .72 Introduction 4 CMOS Inverter Degradation Delay Model 4.1 4.2 Technological Parameters 4.3 ...
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... calculation .91 4.4 4.3.2.4 Delay calculation for fast input transitions 4.3.2.5 Delay calculation for slow input transitions 4.3.3 Output transition time calculation Input - to - Output Coupling Capacitance Modelling 4.4.1 IOCC calculation ...
... calculation .91 4.4 4.3.2.4 Delay calculation for fast input transitions 4.3.2.5 Delay calculation for slow input transitions 4.3.3 Output transition time calculation Input - to - Output Coupling Capacitance Modelling 4.4.1 IOCC calculation ...
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... Calculation of Error Sensitivity in the Propagation Delay With Respect to the Degradation Parameter Error 5.8.1 Sensitivity of the propagation delay with respect to .176 parameter t .177 5.8.2 Sensitivity of the propagation delay with ...
... Calculation of Error Sensitivity in the Propagation Delay With Respect to the Degradation Parameter Error 5.8.1 Sensitivity of the propagation delay with respect to .176 parameter t .177 5.8.2 Sensitivity of the propagation delay with ...
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Common terms and phrases
accurate algorithm Auvergne behavioural model Bellido calculate capacitance cell library chapter characterization process Circuits and Systems CMOS gates CMOS inverter complex considered corresponding curves Daga degra degradation effect degradation parameters delay models delay value dependence devices digital circuits dynamic electrical simulation equations evaluate example expressions frequency function gate level glitches HALOTIS HSPICE IEEE IEEE Transactions implemented inertial delay inertial effect input collisions input pulse input transition Integrated Circuits IOCC linear logic gate logic simulation maximum metastability MOSFET netlist NMOS node normal propagation delay number of inputs number of transitions operation oscillation out7 output load overshoot PMOS post-layout precision region relative error ring oscillator sensitivity shown in Fig signals simplified model static stimuli submicron switching activity Table threshold tion transient analysis transistor transistor level Type 2 collisions types of simulation verification Verilog VLSI waveform width